A browser-based analytical tool for processing and visualizing semiconductor test data in Standard Test Data Format (STDF) and related formats. It solves the problem of quickly inspecting STDF files without dedicated software. It targets engineers and analysts in semiconductor manufacturing and test operations, including those in small to large companies. The tool is positioned as a free, browser-based viewer that processes data locally, ensuring data never leaves the user's machine.
Key features
- Wafer maps
- CPK tables
- Bin pareto
- Parametric trends
- Local data processing
- Free browser-based viewer
- No social media activity within the last 30 days
GTM channels
- No GTM activity detected
ICP
- Data analytics teams
- Engineering teams
- Manufacturing industrial